Trace element mapping using a high‐resolution scanning X‐ray fluorescence microscope equipped with a Kirkpatrick‐Baez mirror system
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Y. Nishino | K. Tamasaku | M. Yabashi | Y. Sano | H. Mimura | K. Yamauchi | S. Matsuyama | H. Yumoto | Soichiro Handa | M. Fujii | T. Ishikawa | Tetsuya Ishikawa | K. Yamauchi | K. Katagishi | S. Handa | Y. Sano | M. Shimura | Mari Shimura