论文信息 - Analysis of Detection Capability of Parallel Signature Analyzers

Analysis of Detection Capability of Parallel Signature Analyzers

A rigorous mathematical analysis is presented to identify error conditions under which aliasing can occur for several common types of serial signature analyzers (SSAs) and parallel signature analyzers (PSAs). The PSAs are faster and require less hardware than the SSAs; however, for PSAs some double errors are a special cause of concern. Such aliasing errors are analyzed and it is shown that PSA pairs can be identified for which these errors are disjoint. Novel reconfigurable PSA designs are presented which use a two-signature scheme to detect all double errors. >

Yinghua Min | Yashwant K. Malaiya | Boping Jin

[1] Mark G. Karpovsky,et al. Testing Computer Hardware through Data Compression in Space and Time , 1983, ITC.

[2] James E. Smith,et al. Measures of the Effectiveness of Fault Signature Analysis , 1980, IEEE Transactions on Computers.

[3] Edward J. McCluskey,et al. Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test Technique , 1986, IEEE Transactions on Computers.

[4] Peter C. Maxwell. Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers , 1988, IEEE Trans. Computers.

[5] Theo J. Powell,et al. Analysis and Simulation of Parallel Signature Analyzers , 1987, ITC.

[6] M. Gruetzner,et al. Aliasing Errors in Signature in Analysis Registers , 1987, IEEE Design & Test of Computers.

[7] Dilip K. Bhavsar,et al. Self-Testing by Polynomial Division , 1981, ITC.

[8] P. C. Maxwell,et al. Suitable polynomials for aliasing reduction by test vector reversal in signature analysers , 1986 .

[9] K. Iwasaki. Analysis and proposal of signature circuits for LSI testing , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[10] Dhiraj K. Pradhan,et al. A new framework for designing and analyzing BIST techniques: computation of exact aliasing probability , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.