Broadband electrical characterization of microwave substrates using T-resonator technique
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This paper presents an improved method for broadband characterization of microwave substrates. The method is based on response measurement of an open microstrip T-resonator and calculations of an effective length of the resonator using given substrate characteristics and electromagnetic 3D analysis. Two Rogers' dielectric substrates are measured: TMM 10 and RO 30101 in 1 to 27 GHz band.
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