SiC BGJFET inverter for high temperature/power applications

SiC buried gate JFET (BGJFET) inverters were designed, implemented, and tested for high-temperature and high-power applications. The main purpose of this study was to investigate the thermal stability of the SiC BGJFETs in a circuit operation as well as to observe the effects of temperature on the circuit performance. The work is subdivided into two major sections: modeling of SiC BGJFETs and simulation of various inverter configurations; and experimental results and observations.