Convergent-beam nano-diffraction, in-line holography and coherent shadow imaging

It is shown that the convergent-beam electron diffraction (CBED) technique first developed by G. Mollenstedt in 1937 has matured to become a highly accurate quantitative method, capable, for example of much greater accuracy than X-ray diffraction for the measurement of the phases of structure factors in acentric crystals. If a field-emission source is used, a number of closely related techniques become possible. These include Fourier imaging, in-line electron holography, low voltage shadow imaging at atomic resolution, Ronchigrams and nanodiffraction