Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.
暂无分享,去创建一个
[1] Jon R. Pratt,et al. Precision and accuracy of thermal calibration of atomic force microscopy cantilevers , 2006 .
[2] Andreas Engel,et al. Friction effects on force measurements with an atomic force microscope , 1993 .
[3] K. V. Van Vliet,et al. Robust approach to maximize the range and accuracy of force application in atomic force microscopes with nonlinear position-sensitive detectors , 2006 .
[4] Richard M. Pashley,et al. Direct measurement of colloidal forces using an atomic force microscope , 1991, Nature.
[5] Hans-Jürgen Butt,et al. Calculation of thermal noise in atomic force microscopy , 1995 .
[6] John E. Sader,et al. Influence of atomic force microscope cantilever tilt and induced torque on force measurements , 2008 .
[7] P. Hansma,et al. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy , 1993 .
[8] Mark W. Rutland,et al. Erratum: “A novel technique for the in situ calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76, 083710 (2005)] , 2006 .
[9] Thomas Thundat,et al. Friction effects in the deflection of atomic force microscope cantilevers , 1994 .
[10] Martyn C. Davies,et al. Molecular Interactions of Biomolecules with Surface-Engineered Interfaces Using Atomic Force Microscopy and Surface Plasmon Resonance , 1999 .
[11] B. Bhushan,et al. Atomic-Scale Friction Measurements Using Friction Force Microscopy. Part 1. General Principles and New Measurement Techniques , 1994 .
[12] C. Neto,et al. In Situ Calibration of Colloid Probe Cantilevers in Force Microscopy: Hydrodynamic Drag on a Sphere Approaching a Wall , 2001 .
[13] Jon R. Pratt,et al. Review of SI traceable force metrology for instrumented indentation and atomic force microscopy , 2005 .
[14] T. Vanderlick,et al. Double Layer Forces over Large Potential Ranges as Measured in an Electrochemical Surface Forces Apparatus , 2001 .
[15] N. Amer,et al. Novel optical approach to atomic force microscopy , 1988 .
[16] John A Kramar,et al. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force. , 2008, The Review of scientific instruments.
[17] Mark W. Rutland,et al. A novel technique for the in situ calibration and measurement of friction with the atomic force microscope , 2005 .
[18] N. Pradeep,et al. Quantification of the meniscus effect in adhesion force measurements , 2006 .
[19] P. Hansma,et al. An atomic-resolution atomic-force microscope implemented using an optical lever , 1989 .
[20] Yon-Kyu Park,et al. Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC) , 2006 .
[21] F. MacKintosh,et al. Scanning probe-based frequency-dependent microrheology of polymer gels and biological cells. , 2000, Physical review letters.
[22] John T Elliott,et al. The stiffness of collagen fibrils influences vascular smooth muscle cell phenotype. , 2007, Biophysical journal.
[23] K. Higashitani,et al. Atomic force microscopy study of the specific adhesion between a colloid particle and a living melanoma cell: Effect of the charge and the hydrophobicity of the particle surface. , 2006, Biophysical journal.
[24] Martin P. Seah,et al. The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis , 2005 .
[25] R. Proksch,et al. Noninvasive determination of optical lever sensitivity in atomic force microscopy , 2006 .
[26] J. Bechhoefer,et al. Calibration of atomic‐force microscope tips , 1993 .
[27] P. Kingshott,et al. Colloid probe AFM investigation of interactions between fibrinogen and PEG-like plasma polymer surfaces. , 2006, Langmuir : the ACS journal of surfaces and colloids.
[28] Richard S Gates,et al. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. , 2007, The Review of scientific instruments.
[29] John E. Sader,et al. General scaling law for stiffness measurement of small bodies with applications to the atomic force microscope , 2005 .
[30] John Hedley,et al. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI , 2003, Nanotechnology.
[31] Jon R. Pratt,et al. Prototype cantilevers for SI-traceable nanonewton force calibration , 2006 .
[32] H. Butt,et al. Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope. , 1991, Biophysical journal.
[33] Hans-Jürgen Butt,et al. Adhesion and Friction Forces between Spherical Micrometer-Sized Particles , 1999 .
[34] R. Colton,et al. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope , 1989 .
[35] Jon R. Pratt,et al. The NIST microforce realization and measurement project , 2002, Conference Digest Conference on Precision Electromagnetic Measurements.
[36] Lutz Doering,et al. Piezoresistive cantilever as portable micro force calibration standard , 2003 .
[37] Jon R. Pratt,et al. Progress toward Système International d’Unités traceable force metrology for nanomechanics , 2004 .
[38] J. Kramar,et al. Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard. , 2007, The Review of scientific instruments.
[39] M. Rutland,et al. Thermal calibration of photodiode sensitivity for atomic force microscopy , 2006 .
[40] Mark W. Rutland,et al. Dynamic Surface Force Measurement. 2. Friction and the Atomic Force Microscope , 1998 .
[41] S. Okuma,et al. A method for determining the spring constant of cantilevers for atomic force microscopy , 1996 .
[42] Gus Gurley,et al. Short cantilevers for atomic force microscopy , 1996 .
[43] Jason Cleveland,et al. Finite optical spot size and position corrections in thermal spring constant calibration , 2004 .
[44] Saltuk B. Aksu,et al. Calibration of atomic force microscope cantilevers using piezolevers. , 2007, The Review of scientific instruments.