ASM 시스템의 slotted modulation mask 측정환경 구성

This paper presents environment configuration for the measure of the slotted modulation mask characteristics of a newly developed application specific message (ASM) system. The environment utilizes a test vector generated through a sample rate scaling of a long term evolution (LTE) signal with the Agilent MXG signal generator in which a careful operation is emphasized. The environment will be employed in the development process of a power amplifier (PA) of the ASM system.