Decay of secondary electron emission and charging of hydrogenated and hydrogen-free diamond film surfaces induced by low energy electrons

In this work, the decay of secondary-electron emission (SEE) intensity and charging of hydrogenated and hydrogen-free diamond film surfaces subjected to incident electron irradiation at energies between 5 and 20 eV are investigated. Electron emission curves as a function of incident electron energy were measured. For the hydrogenated films, it was found that the SEE intensity decays in intensity under continuous electron irradiation, albeit maintains a nearly constant onset. The decay in time of the SEE intensity was measured for various incident electron energies. From these measurements, the SEE intensity decay rate from the hydrogenated diamond surface was calculated as a function of incident electron energy and found to display a broad peak at ∼9 eV. The decay of the SEE intensity is explained as due to electron trapping in the near-surface region of the hydrogenated diamond films resulting in the formation of a depletion layer and upward surface band bending while overall charge neutrality is maintai...

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