Characteristic improvement on conducted disturbance measuring apparatus using TEM cells

A conducted disturbance measuring apparatus using two TEM cells needs a jig which connects an AC plug of an EUT to coaxial connector of the TEM cell. We designed the low loss jig for improving the voltage division factor (VDF) of the apparatus. In this paper, the VDF with the designed jig is evaluated. As a result, the VDF is improved maximum 20 dB compared with that by using the conventional one, and the effectiveness of the designed jig is confirmed.

[1]  C. F. M. Carobbi,et al.  The Effect of the Imperfect Realization of the Artificial Mains Network Impedance on the Reproducibility of Conducted Emission Measurements , 2012, IEEE Transactions on Electromagnetic Compatibility.

[2]  K. Gotoh,et al.  Measurement and modeling of electromagnetic noise from LED light bulbs , 2013, IEEE Electromagnetic Compatibility Magazine.

[3]  Sugiura Akira,et al.  Characterization of a V-type Artificial Mains Network in Terms of the Scattering Parameters , 2014 .

[4]  Osami Wada,et al.  Calibration Methods for AC-Coaxial Adapter Used in AMN Impedance Measurements , 2016, IEEE Transactions on Electromagnetic Compatibility.

[5]  Ifong Wu,et al.  Impedance characterastic of new type measurement system for measuring conducted disturbance , 2017, 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

[6]  Ryosuke Suga,et al.  Characteristic evaluation of conducted disturbance measuring apparatus using two parallel TEM cells , 2016, 2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE.