Snapthrough occurring in the postbuckling of thin films

The postbuckling transition from an initially straight-sided wrinkle to a distribution of bubbles has been investigated by means of finite element simulations in the case of a thin film relying on a rigid substrate. The calculations show that a snapthrough occurs when the buckling wavelength exceeds a critical value. Experimental atomic force microscopy observations of this transition have been reported and found to be in good agreement with the calculations.