Deformation potential constants of biaxially tensile stressed Ge epitaxial films on Si ( 100 )
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Yasuhiko Ishikawa | Kazumi Wada | Jurgen Michel | Lionel C. Kimerling | D. D. Cannon | Samerkhae Jongthammanurak | Douglas D. Cannon | J. Michel | L. Kimerling | Jifeng Liu | K. Wada | S. Jongthammanurak | D. T. Danielson | Y. Ishikawa | Jifeng Liu | David T. Danielson
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