论文信息 - A fault injection system for space imaging application

A fault injection system for space imaging application

The SRAM-based FPGAs are widely used in space imaging system because of their reprogramming advantages. However, designers must be concerned with the effect of single event upset(SEU) on FPGA configuration memory in the space application. To evaluate the performance of SRAM-based FPGA against SEU, simulating SEU fault injection test is a common method. This paper mainly studies the method of fault injection test and the structure of test platform. The data of CCD driving timing is flipped bit by bit on the test platform. And finally count the fault rate is 1.25%, then taking about 240ms to repair the fault.

Tengfei Ma | Yongqiang Duan | Jinqiao Wang

[1] I. Xilinx,et al. Virtex-II Platform FPGA User Guide , 2002 .

[2] Matteo Sonza Reorda,et al. An Error-Detection and Self-Repairing Method for Dynamically and Partially Reconfigurable Systems , 2017, IEEE Transactions on Computers.

[3] Carl Carmichael,et al. Triple Module Redundancy Design Techniques for Virtex FPGAs, Application Note 197 , 2001 .

[4] Michael J. Wirthlin,et al. FPGA partial reconfiguration via configuration scrubbing , 2009, 2009 International Conference on Field Programmable Logic and Applications.

[5] M. Caffrey,et al. Correcting single-event upsets through virtex partial configuration , 2000 .