论文信息 - X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy - 字舞流文

X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy

N. Cherkashin | V. Kaganer | M. Baidakova | M. Yagovkina | A. Nikolaev | W. Lundin | E. V. Verkhovtceva | V. Kopp | V. Wsevolod | Lundin | Andrey E. Nikolaev