Degradation-Mode Analysis for Highly Reliable GaN-HEMT
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K. Makiyama | N. Hara | M. Kanamura | K. Joshin | H. Shigematsu | Y. Inoue | S. Masuda | T. Ohki | N. Okamoto | T. Kikkawa | H. Shigematsu | K. Imanishi | N. Hara | N. Okamoto | M. Kanamura | T. Kikkawa | K. Joshin | K. Makiyama | S. Masuda | Y. Inoue | T. Ohki | K. Imanishi
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