Effects of package on the performance of MEMS piezoresistive accelerometers
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Ping Li | Jun Liu | Yunbo Shi | Shiqiao Gao | Yunbo Shi | Shiqiao Gao | Haipeng Liu | Ping Li | Jun Liu | Haipeng Liu
[1] Yun Huang,et al. Investigation and simulation on the dynamic shock response performance of packaged high-g MEMS accelerometer versus the impurity concentration of the piezoresistor , 2009, Microelectron. Reliab..
[2] Soeren Hirsch,et al. A silicon test chip for the thermomechanical analysis of MEMS packagings , 2008 .
[3] Jürgen Wilde,et al. Impact of high-g and high vibration environments on piezoresistive pressure sensor performance , 2009 .
[4] S. Das,et al. CMOS compatible bulk micromachined silicon piezoresistive accelerometer with low off-axis sensitivity , 2006, Microelectron. J..
[5] Chun-Te Lin,et al. Performance and package effect of a novel piezoresistive pressure sensor fabricated by front-side etching technology , 2005 .
[6] Weidong Huang,et al. Packaging effects on the performances of MEMS for high-G accelerometer with double-cantilevers , 2003 .
[8] Klaus Thoma,et al. Novel piezoresistive high-g accelerometer geometry with very high sensitivity-bandwidth product , 2012 .
[9] Kevin T. Kornegay,et al. Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers , 2003 .
[10] Qing-An Huang,et al. Influence of environmental temperature on the dynamic properties of a die attached MEMS device , 2009 .
[11] S. Walwadkar,et al. Evaluation of Die Stress in MEMS Packaging: Experimental and Theoretical Approaches , 2006, IEEE Transactions on Components and Packaging Technologies.
[12] Stefano Mariani,et al. Multi-scale analysis of polysilicon MEMS sensors subject to accidental drops: Effect of packaging , 2009, Microelectron. Reliab..
[13] C. Hsueh. Thermal Stresses in Elastic Multilayer Systems , 2002 .
[14] Jeremy A. Walraven,et al. MEMS reliability in shock environments , 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
[15] Brady R. Davies,et al. High-G MEMS integrated accelerometer , 1997, Smart Structures.
[16] R. A. Lawes,et al. Manufacturing costs for microsystems/MEMS using high aspect ratio microfabrication techniques , 2006 .
[17] S. M. Spearing,et al. Materials issues in microelectromechanical systems (MEMS) , 2000 .
[18] Liu,et al. Fabrication and measurement of high-g MEMS accelerometer , 2008 .
[19] D. M. Tanner,et al. MEMS reliability: Where are we now? , 2009, Microelectron. Reliab..
[20] F. Xuan,et al. Modeling of creep deformation and its effect on stress distribution in multilayer systems under residual stress and external bending , 2009 .
[21] S. O. Oyadiji,et al. Influence of adhesive characteristics on the transverse free vibration of single lap-jointed cantilevered beams , 2001 .
[22] Yuelin Wang,et al. A high-performance micromachined piezoresistive accelerometer with axially stressed tiny beams , 2005 .
[23] V. Teixeira. Numerical analysis of the influence of coating porosity and substrate elastic properties on the residual stresses in high temperature graded coatings , 2001 .
[24] G. Q. Zhang,et al. Failure analysis of a thin-film nitride MEMS package , 2008, Microelectron. Reliab..
[25] Francesca Campabadal,et al. Flip-chip packaging of piezoresistive pressure sensors , 2006 .