Characterizing a noninsertable directional device using the NIST uncertainty framework
暂无分享,去创建一个
Dylan F. Williams | Jeffrey A. Jargon | Michael D. Janezic | Paul D. Hale | Dylan F. Williams | M. Janezic | P. Hale | J. Jargon
[1] Paul Penfield,et al. De-Embedding and Unterminating , 1974 .
[2] A. Dienstfrey,et al. Calibration of sampling oscilloscopes with high-speed photodiodes , 2006, IEEE Transactions on Microwave Theory and Techniques.
[3] Jack C. M. Wang,et al. An optimal vector-network-analyzer calibration algorithm , 2003 .
[4] J. Randa,et al. Comparison of adapter characterization methods , 1999 .
[5] Dylan F. Williams,et al. > Replace This Line with Your Paper Identification Number (double-click Here to Edit) < , 2022 .
[6] Howard C. Reader,et al. Wideband Frequency-Domain Characterization of High-Impedance Probes , 2001, 58th ARFTG Conference Digest.
[7] Arkadiusz Lewandowski,et al. Multi-frequency approach to vector-network-analyzer scattering-parameter measurements , 2010, The 40th European Microwave Conference.
[8] P. D. Hale,et al. Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework , 2012, 79th ARFTG Microwave Measurement Conference.
[9] U. Arz,et al. Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework , 2012, 80th ARFTG Microwave Measurement Conference.
[10] J. Martens. Common adapter/fixture extraction techniques: sensitivities to calibration anomalies , 2009, 2009 74th ARFTG Microwave Measurement Conference.
[11] U. Arz,et al. Coplanar microwave probe characterization: Caveats and pitfalls , 2006, 2006 67th ARFTG Conference.
[12] Dylan F. Williams,et al. Covariance-Based Vector-Network-Analyzer Uncertainty Analysis for Time- and Frequency-Domain Measurements , 2010, IEEE Transactions on Microwave Theory and Techniques.