Effect of internal stress on short-circuit diffusion in thin films and nanolaminates: Application to Cu/W nano-multilayers
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A. V. Druzhinin | J. Janczak-Rusch | L. Jeurgens | C. Cancellieri | B. Straumal | S. Siol | B. Rheingans | A. Druzhinin | J. Janczak‐Rusch