Application of semiconductor laser on big dimension measuring system

The structure and principles of an optical non-contact measuring system of large-dimension diameter were analyzed in detail in the paper. This system can be used to measure up to the diameter of 2200 millimeters. And it also can be used to measure the coaxiality of inner and outside of cirque. Moreover, the system can realize measurement of on-line parameters in processing. The ultimate errors in measuring large-dimension diameter are less than 0.02 millimeters.