论文信息 - Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes - 字舞流文

Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

N. Koch | F. Hofer | F. Wenzl | G. Leising | G. Jakopic | C. Suess | C. Mitterbauer | A. Haase | S. Muellegger | M. Schatzmayr | M. Wuchse | K. Lamprecht