论文信息 - Probing the ex situ morphology of Ge islands on Si(001): AFM and XPS inelastic peak shape analysis - 字舞流文

Probing the ex situ morphology of Ge islands on Si(001): AFM and XPS inelastic peak shape analysis

A. Larsen | J. L. Hansen | S. Tougaard | A. Nylandsted Larsen | A. C. Simonsen | A. Cohen Simonsen