Application of low energy charged particle beams for chlorine analysis in silicon samples
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[1] G. Brunner,et al. Application of low-energy ion beams , 1984 .
[2] G. Lindner,et al. Specific applications of a 350 kv ion accelerator for PIXE analysis of solid state samples , 1984 .
[3] M. Jaskóła,et al. Comparison of different methods for eliminating the charge build-up on insulating samples in pixe analysis , 1983 .
[4] olker Rössiger. Depth profiling in the near surface region by low energy PIXE , 1982 .
[5] S. Miyagawa,et al. Sensitivity in light element analysis by 2 MeV and 150 keV proton and photon induced X-rays , 1978 .
[6] K. Ishii,et al. A study on proton induced X-ray analysis and its application to environmental samples , 1977 .
[7] J. Borggreen,et al. Sensitivity in trace-element analysis by p, α and 16O induced X-rays , 1974 .
[8] C. Gaarde,et al. Proton induced X-ray emission as a tool for trace element analysis , 1974 .