Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states
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Gaudenzio Meneghesso | Michele Muccini | Nicola Wrachien | Andrea Cester | N. Lago | Riccardo D'Alpaos | Andrea Stefani | Guido Turatti | N. Wrachien | M. Muccini | A. Cester | G. Meneghesso | A. Stefani | G. Turatti | Nicolò Lago | R. D'Alpaos
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