In order to promote the measurement accuracy to sub-50 nrad rms for both spherical and plane mirror tests and to resolve the difficulty in testing strongly curved mirror by use of the NOM, the Nano-accuracy Surface Profiler (NSP) was developed. The NSP system applies scanning sampling beam in fixed scanning distance combined with non-tilted reference beam for removing pitch error of scanning slide to ensure sub-50 nrad rms accuracy measurement. The NSP takes the advantage of the NOM in using precise autocollimator (Elcomat 3000) for both sampling and reference beams. In preliminary test, this NSP scheme verifies it has at least the same measurement accuracy as the NOM for plane mirror test. The NSP system scheme significantly reduces test error than the NOM for sphere test, and it also ensures the capability using single calibration curve to further correct systematic error in reaching sub-50 nrad rms accuracy for spherical mirror test.
[1]
Shinan Qian,et al.
The penta‐prism LTP: A long‐trace‐profiler with stationary optical head and moving penta prism (abstract)a)
,
1995
.
[2]
Kun Qian,et al.
Systematic error reduction: non-tilted reference beam method for long trace profiler
,
2007,
SPIE Optical Engineering + Applications.
[3]
Michael Schulz,et al.
Scanning deflectometric form measurement avoiding path-dependent angle measurement errors
,
2010
.
[4]
Ralf D. Geckeler,et al.
Approaching sub-50 nanoradian measurements by reducing the saw-tooth deviation of the autocollimator in the Nano-Optic-Measuring Machine
,
2015
.
[5]
Shinan Qian,et al.
Design of multiple-function long trace profiler
,
2007
.