Effects of nitridation on SiC/SiO2 structures studied by hard X-ray photoelectron spectroscopy
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G. Pobegen | T. Aichinger | J. Lischner | A. Regoutz | Tien-Lin Lee | P. Thakur | M. Mascheck | T. Wiell | J. Berens | S. Eriksson | S. Bichelmaier | M. V. Mistry | N. K. Fernando | J. Matthias Kahk