Ultrawideband measurement of multiple-port MMICs using nonideal test fixtures and a 2-port ANA

Techniques for accurately determining ultrawideband multiple-port S-parameter measurements for MMICs housed in nonideal test fixtures, using 2-port ANA measurements, are presented. Deconvolution is performed with an equivalent circuit model for each port test jig, and matrix renormalisation transformations are employed to remove the effects of the mismatched loads on the auxiliary ports. Examples of 2-port deconvolution and multiple port renormalisation are treated separately and serve to illustrate the effectiveness of each technique. The results of the combined deconvolution/renormalisation processes on an experimental MMIC directional coupler are presented. In addition, the effectiveness of the renormalisation process on multiple-port on-wafer probed measurements is discussed.