Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal

In practical printed circuit board (PCB) designs, electromagnetic interference (EMI) is coupled from the ground plane, which is commonly shared among the analog, digital, and mixed-signal integrated circuits. This noisy ground plane couples interference capacitively to all the IC pins, including the output: this effect is exacerbated when the IC is connected to long wires and traces that are routed close to the conductive ground plane. This paper reports on the effect of interference, which is coupled capacitively from the PCB ground plane into all the IC pins of an opamp connected as a voltage buffer. Simulations illustrate the susceptibilities in custom operational amplifier designs, and are corroborated by measurements on several commercial devices. These measurements show that the EMI-induced offset can attain considerable values for the most critical EMI frequencies, which lie between 10 and 100 MHz. Moreover, these illustrate that there is a considerable susceptibility of operational amplifiers to electromagnetic interference coupled to their output pins.

[1]  Frank Leferink,et al.  Current intentional EMI studies in Europe with a focus on STRUCTURES , 2014, 2014 International Symposium on Electromagnetic Compatibility, Tokyo.

[2]  Kachout Mnaouer,et al.  Modeling of microstrip and PCB traces to enhance crosstalk reduction , 2010, 2010 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering (SIBIRCON).

[4]  Paolo Stefano Crovetti.  Operational amplifier immune to EMI with no baseband performance degradation , 2010 .

[5]  P. Tomasin,et al.  Analysis of EMI effects in Op-Amp ICs: measurement techniques and numerical prediction , 2001, 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161).

[6]  Jean-Michel Redoute,et al.  EMI resisting CMOS differential pair structure , 2006 .

[7]  F. Fiori.  Design of an Operational Amplifier Input Stage Immune to EMI , 2007, IEEE Transactions on Electromagnetic Compatibility.

[8]  Georges G. E. Gielen,et al.  Design automation towards reliable analog integrated circuits , 2010, 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

[9]  L. Colalongo,et al.  Reduction of EMI Susceptibility in CMOS Bandgap Reference Circuits , 2006, IEEE Transactions on Electromagnetic Compatibility.

[10]  R. Kureemun,et al.  Increasing the reliability of embedded automotive applications in the presence of EMI: a pilot study , 1999 .

[11]  M. Steyaert,et al.  An EMI Resisting LIN Driver in 0.35-micron High-Voltage CMOS , 2007, IEEE Journal of Solid-State Circuits.

[12]  Xiaomin Duan,et al.  An Efficient Analysis of Power/Ground Planes With Inhomogeneous Substrates Using the Contour Integral Method , 2014, IEEE Transactions on Electromagnetic Compatibility.

[13]  Frank Leferink,et al.  Robustness of a TETRA Base Station Receiver Against Intentional EMI , 2015, IEEE Transactions on Electromagnetic Compatibility.

[14]  Jean-Michel Redoute,et al.  A fundamental approach to EMI resistant folded cascode operational amplifier design , 2013, 2013 International Symposium on Electromagnetic Compatibility.

[15]  Francesco Centurelli,et al.  Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies , 2009, IEEE Transactions on Circuits and Systems II: Express Briefs.

[16]  Jean-Michel Redoute,et al.  A methodological approach to EMI resistant analog integrated circuit design , 2015, IEEE Electromagnetic Compatibility Magazine.

[17]  L. Colalongo,et al.  Robust design of low EMI susceptibility CMOS OpAmp , 2004, IEEE Transactions on Electromagnetic Compatibility.

[18]  A. S. Poulton.  Effect of conducted EMI on the DC performance of operational amplifiers , 1994 .

[19]  Behzad Razavi,et al.  A 7.1 mW 1 GS/s ADC With 48 dB SNDR at Nyquist Rate , 2014, IEEE J. Solid State Circuits.

[20]  M.A. Stuchly,et al.  Numerical modeling of pacemaker interference in the electric-utility environment , 2005, IEEE Transactions on Device and Materials Reliability.

[21]  Christos Christopoulos,et al.  Introduction to Electromagnetic Compatibility , 2007 .

[22]  Jeremy Raoult,et al.  Effect of Low and High Power Continuous Wave Electromagnetic Interference on a Microwave Oscillator System: From VCO to PLL to QPSK Receiver , 2014, IEEE Transactions on Electromagnetic Compatibility.

[23]  Edward J. McCluskey,et al.  Common-mode failures in redundant VLSI systems: a survey , 2000, IEEE Trans. Reliab..

[24]  Maryam Shojaei Baghini,et al.  A balanced CMOS OpAmp with high EMI immunity , 2014, 2014 International Symposium on Electromagnetic Compatibility.

[25]  Nicolò Speciale,et al.  Failures induced on bipolar operational amplifiers from electromagnetic interferences conducted on the power supply rails , 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

[26]  Kyechong Kim,et al.  Theoretical Foundation for Upsets in CMOS Circuits Due to High-Power Electromagnetic Interference , 2010, IEEE Transactions on Device and Materials Reliability.

[27]  Jiancheng Li,et al.  Modeling and Simulation of LDO Voltage Regulator Susceptibility to Conducted EMI , 2014, IEEE Transactions on Electromagnetic Compatibility.

[28]  Jean-Michel Redoute,et al.  Increasing the EMI immunity of CMOS operational amplifiers using an on-chip common-mode cancellation circuit , 2014, 2014 International Symposium on Electromagnetic Compatibility.

[29]  A Richelli.  CMOS OpAmp Resisting to Large Electromagnetic Interferences , 2010, IEEE Transactions on Electromagnetic Compatibility.

[30]  Robert Weigel,et al.  Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops , 2012, IEEE Transactions on Electromagnetic Compatibility.

[31]  Luigi Colalongo,et al.  Increasing the immunity to electromagnetic interferences of CMOS OpAmps , 2003, IEEE Trans. Reliab..

[32]  Jean-Michel Redoute,et al.  Efficient reduction of electromagnetic interference effects in operational amplifiers , 2007 .

[33]  Jean-Michel Redoute,et al.  Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18 μm CMOS , 2015, Microelectron. Reliab..

[34]  N. K. Agarwal.  EMI control in high reliability space systems , 1999, Proceedings of the International Conference on Electromagnetic Interference and Compatibility.

[35]  Shantanu Das,et al.  Quenching the conducted emission hazards for heliborne time domain electromagnetic exploration system , 2010, 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH).

[36]  Jaime Ramirez-Angulo,et al.  Compact low-voltage class-AB analogue buffer , 2006 .

[37]  Byung Kook Kim,et al.  Task-scheduling strategies for reliable TMR controllers using task grouping and assignment , 2000, IEEE Trans. Reliab..

[38]  Ariel Lutenberg,et al.  Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI , 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

[39]  A. SiemensCNXS.p.,et al.  Evaluation of the Effective Electrical Parameters of a PCB Trace for Accurate Signal Integrity Simulations , 2004 .

[40]  Emilio Sardini,et al.  Chaotic behavior of 741 opamps subjected to EMI conveyed to power supply rails , 2000, 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353).

[41]  Keith Armstrong.  Why increasing immunity test levels is not sufficient for high-reliability and critical equipment , 2009, 2009 IEEE International Symposium on Electromagnetic Compatibility.

[42]  Anna Richelli.  Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps , 2012, IEEE Transactions on Electromagnetic Compatibility.

[43]  Heyno Garbe,et al.  A Cost-Efficient System for Detecting an Intentional Electromagnetic Interference (IEMI) attack , 2014, 2014 International Symposium on Electromagnetic Compatibility.

[44]  G. K. Deb.  Achieving the enhanced reliability of electronic system by application of EMI control measures , 1997, IEEE 1997, EMC, Austin Style. IEEE 1997 International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.97CH36113).

[45]  Yuan Liu,et al.  Sensitive analysis of EMI effect in the μA741 operational amplifier circuit , 2013, 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE).

[46]  Alex S. Weddell,et al.  Photovoltaic Sample-and-Hold Circuit Enabling MPPT Indoors for Low-Power Systems , 2012, IEEE Transactions on Circuits and Systems I: Regular Papers.