Stabilized cubic zirconia: A Raman study under uniaxial stress

Yttria‐stabilized cubic zirconia has been studied at 300 K by use of Raman spectroscopy under uniaxial stress along the [001] and [111] directions. The main effects observed are the frequency shifts of the F2g‐type Raman band at ∼610 cm−1 which vary linearly with the applied stress and tend to increase with Y2O3 concentration. Effective deformation potentials are determined for the F2g band. These potentials are necessary for strain characterization of stabilized cubic zirconia, in buffer or epitaxial film configurations. Polycrystalline yttria‐stabilized tetragonal zirconia is likewise studied.

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