Online error detection and correction of erratic bits in register files
暂无分享,去创建一个
Jaume Abella | Javier Carretero | Xavier Vera | Antonio González | Pedro Chaparro | J. Abella | P. Chaparro | X. Vera | J. Carretero | Antonio González
[1] Todd M. Austin,et al. DIVA: a reliable substrate for deep submicron microarchitecture design , 1999, MICRO-32. Proceedings of the 32nd Annual ACM/IEEE International Symposium on Microarchitecture.
[2] Eric Rotenberg,et al. AR-SMT: a microarchitectural approach to fault tolerance in microprocessors , 1999, Digest of Papers. Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing (Cat. No.99CB36352).
[3] Wei Liu,et al. Using Register Lifetime Predictions to Protect Register Files Against Soft Errors , 2008 .
[4] Mahmut T. Kandemir,et al. Increasing register file immunity to transient errors , 2005, Design, Automation and Test in Europe.
[5] Robert E. Lyons,et al. The Use of Triple-Modular Redundancy to Improve Computer Reliability , 1962, IBM J. Res. Dev..
[6] Robert Baumann,et al. Soft errors in advanced computer systems , 2005, IEEE Design & Test of Computers.
[7] Kaushik Roy,et al. A 160 mV, fully differential, robust schmitt trigger based sub-threshold SRAM , 2007, Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07).
[8] Eric Rotenberg,et al. Slipstream processors: improving both performance and fault tolerance , 2000, SIGP.
[9] Shubhendu S. Mukherjee,et al. Detailed design and evaluation of redundant multithreading alternatives , 2002, ISCA.
[10] Lisa Spainhower,et al. IBM S/390 Parallel Enterprise Server G5 fault tolerance: A historical perspective , 1999, IBM J. Res. Dev..
[11] J. Jopling,et al. Erratic fluctuations of sram cache vmin at the 90nm process technology node , 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
[12] Israel Koren,et al. Defect tolerance in VLSI circuits: techniques and yield analysis , 1998, Proc. IEEE.
[13] Francky Catthoor,et al. Guest Editors' Intoduction: The New World of Large Embedded Memories , 2001, IEEE Des. Test Comput..
[14] David I. August,et al. Design and evaluation of hybrid fault-detection systems , 2005, 32nd International Symposium on Computer Architecture (ISCA'05).
[15] Diana Marculescu,et al. Power efficiency of voltage scaling in multiple clock, multiple voltage cores , 2002, ICCAD 2002.
[16] Irith Pomeranz,et al. Transient-Fault Recovery for Chip Multiprocessors , 2003, IEEE Micro.
[17] Sandhya Dwarkadas,et al. Dynamic frequency and voltage control for a multiple clock domain microarchitecture , 2002, 35th Annual IEEE/ACM International Symposium on Microarchitecture, 2002. (MICRO-35). Proceedings..
[18] Chin-Long Chen,et al. Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review , 1984, IBM J. Res. Dev..
[19] E.S. Fetzer,et al. The Parity protected, multithreaded register files on the 90-nm itanium microprocessor , 2006, IEEE Journal of Solid-State Circuits.
[20] David I. August,et al. SWIFT: software implemented fault tolerance , 2005, International Symposium on Code Generation and Optimization.
[21] Rochit Rajsuman. Design and Test of Large Embedded Memories: An Overview , 2001, IEEE Des. Test Comput..
[22] Joel Emer,et al. A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor , 2003, Proceedings. 36th Annual IEEE/ACM International Symposium on Microarchitecture, 2003. MICRO-36..
[23] G. Atwood,et al. Erratic Erase In ETOX/sup TM/ Flash Memory Array , 1993, Symposium 1993 on VLSI Technology.