Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs
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S. Gerardin | A. Paccagnella | D. Cornale | S. Michelis | F. Faccio | A. Paccagnella | F. Faccio | S. Gerardin | D. Cornale | S. Michelis
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