论文信息 - Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction - 字舞流文

Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction

E. Bourhis | O. Castelnau | G. Geandier | P. Renault | P. Goudeau | D. Thiaudiére | D. Faurie | S. Djaziri