On Synchronizable Circuits and Their Synchronizing Sequences
暂无分享,去创建一个
Tadeusz Luba | Michael Burns | R. Lisanke | Marek Perkowski | S. Grygiel | P. Burkey | N. Iliev | R. Malvi | Z. Wang | H. Wu | F. Yang | S. Zhou | J. Zhang
[1] Elizabeth Marie Rudnick. Simulation-Based Techniques for Sequential Circuit Testing , 1994 .
[2] Seh-Woong Jeong,et al. Exact calculation of synchronization sequences based on binary decision diagrams , 1992, [1992] Proceedings 29th ACM/IEEE Design Automation Conference.
[3] I. Pomeranz,et al. Fault simulation for synchronous sequential circuits under the multiple observation time testing approach , 1993, Proceedings ETC 93 Third European Test Conference.
[4] Irith Pomeranz,et al. On Removing Redundancies from Synchronous Sequential Circuits with Synchronizing Sequences , 1996, IEEE Trans. Computers.
[5] Carl Pixley,et al. Minimum Length Synchronizing Sequences of Finite State Machine , 1993, 30th ACM/IEEE Design Automation Conference.
[6] Irith Pomeranz,et al. The Multiple Observation Time Test Strategy , 1992, IEEE Trans. Computers.
[7] Daniel G. Saab,et al. Initialization of Sequential Circuits and its Application to ATPG , 1998, J. Electron. Test..
[8] Yvon Savaria,et al. Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors , 1995, IEEE Trans. Computers.
[9] Vishwani D. Agrawal,et al. Initializability Consideration in Sequential Machine Synthesis , 1992, IEEE Trans. Computers.
[10] Irith Pomeranz,et al. Synchronization of large sequential circuits by partial reset , 1996, Proceedings of 14th VLSI Test Symposium.
[11] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[12] Irith Pomeranz,et al. MIX: a test generation system for synchronous sequential circuits , 1998, Proceedings Eleventh International Conference on VLSI Design.
[13] Daniel G. Saab,et al. On the initialization of sequential circuits , 1994, Proceedings., International Test Conference.
[14] Seh-Woong Jeong,et al. Synchronizing sequences and symbolic traversal techniques in test generation , 1993, J. Electron. Test..
[15] Bernd Becker,et al. A hybrid fault simulator for synchronous sequential circuits , 1994, Proceedings., International Test Conference.