A new high level testability measure: description and evaluation

A high testability measure based on constraints propagation and dedicated to deterministic test of the combinational part of scannable circuits is compared to three others high level testability measures of the literature. This measure is used to guide hierarchical generation of test vectors and automatic test point insertion.<<ETX>>

[1]  Jacob A. Abraham,et al.  An easily computed functional level testability measure , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[2]  Kaushik Roy,et al.  High level test generation using data flow descriptions , 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

[3]  Premachandran R. Menon,et al.  An approach to functional level testability analysis , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[4]  R. G. Bennetts,et al.  Erratum: CAMELOT: a computer-aided measure for logic testability , 1981 .

[5]  Didier Crestani,et al.  Automatic partitioning for deterministic test , 1992, Proceedings EURO-DAC '92: European Design Automation Conference.

[6]  John P. Hayes,et al.  Hierarchical test generation using precomputed testsd for modules , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[7]  S. Freeman.  Test generation for data-path logic: the F-path method , 1988 .

[8]  Jack Edward Stephenson,et al.  A testability measure for register-transfer level digital circuits , 1974 .

[9]  Didier Crestani,et al.  A Hierarchical Test Generation Using High Level primitives , 1993, The Sixth International Conference on VLSI Design.

[10]  L. H. Goldstein,et al.  SCOAP: Sandia Controllability/Observability Analysis Program , 1988, 17th Design Automation Conference.

[11]  Robert B. Ash,et al.  Information Theory , 2020, The SAGE International Encyclopedia of Mass Media and Society.

[12]  Chantal Robach,et al.  CATA: A Computer-Aided Test Analysis System , 1984, IEEE Design & Test of Computers.

[13]  Premachandran R. Menon,et al.  Symbolic test generation for hierarchically modeled digital systems , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[14]  Jacob A. Abraham,et al.  Functional Testing of Microprocessors , 1984, IEEE Transactions on Computers.