A built-in self-test scheme for 3D RAMs
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Ding-Ming Kwai | Jin-Fu Li | Cheng-Wen Wu | Chih-Yen Lo | Yung-Fa Chou | Che-Wei Chou | Yun-Chao You | Yung-Fa Chou | D. Kwai | Cheng-Wen Wu | Jin-Fu Li | Chih-Yen Lo | Yun-Chao You | Che-Wei Chou
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