Dielectric-resonator-based measuring devices: Relevance of the dielectric quality

Sapphire-based, cylindrical dielectric — loaded microwave resonators are increasingly popular to measure the electrical, magnetic and dielectric response of various substances and materials. While it is generally accepted that “high-quality” dielectrics are necessary to obtain the best performances of a resonator as a measuring device, a quantitative assessment of the impact of the quality of the anisotropic dielectric on the performances is lacking. We study the effect of a miscut of the crystal on the properties of dielectric resonators, relevant to the performances as a measuring device. We find that mode distortion, sufficiently severe to affect the measurand, can arise with commercial-grade crystals. We give quantitative estimates on the acceptable tolerance on the crystal miscut.

[1]  J. Krupka,et al.  Microwave and RF methods of contactless mapping of the sheet resistance and the complex permittivity of conductive materials and semiconductors , 2011 .

[2]  Jerzy Krupka,et al.  Dielectric properties of single crystals of Al/sub 2/O/sub 3/, LaAlO/sub 3/, NdGaO/sub 3/, SrTiO/sub 3/, and MgO at cryogenic temperatures , 1994 .

[3]  N. Cherpak,et al.  Two-layered disc quasi-optical dielectric resonators: electrodynamics and application perspectives for complex permittivity measurements of lossy liquids , 2007 .

[4]  Kostiantyn Torokhtii,et al.  Design and test of a microwave resonator for the measurement of resistivity anisotropy , 2017 .

[5]  Resonant Modes in Shielded Uniaxial-Anisotropic , 1993 .

[6]  B. T. G. Tan,et al.  Amendment of cavity perturbation method for permittivity measurement of extremely low-loss dielectrics , 1999, IEEE Trans. Instrum. Meas..

[7]  J. Krupka,et al.  Complex permeability of demagnetized microwave ferrites near and above gyromagnetic resonance , 1996 .

[8]  Yun Wu,et al.  Microwave study of FeSe0.3Te0.7 thin film by TE011-mode sapphire dielectric resonator , 2010, 2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES.

[9]  Michael E. Tobar,et al.  Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures , 1999 .

[10]  J. Hyde,et al.  Dielectric microwave resonators in TE(011) cavities for electron paramagnetic resonance spectroscopy. , 2008, The Review of scientific instruments.

[11]  Janina Mazierska,et al.  Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonators (corrected) , 2001 .

[12]  Jerzy Krupka,et al.  A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature , 1998 .

[13]  Kostiantyn Torokhtii,et al.  A rectangular dielectric resonator for measurements of the anisotropic microwave properties in planar conductors , 2014 .

[14]  The application of two- and three-layer dielectric resonators to the investigation of liquids in the microwave region , 1988 .

[15]  Janina Mazierska,et al.  Precise measurements of the Q factor of dielectric resonators in the transmission mode-accounting for noise, crosstalk, delay of uncalibrated lines, coupling loss, and coupling reactance , 2002 .

[16]  Kostiantyn Torokhtii,et al.  Wideband Surface Impedance Measurements in Superconducting Films , 2016, IEEE Transactions on Instrumentation and Measurement.

[17]  Jerzy Krupka,et al.  Contactless methods of conductivity and sheet resistance measurement for semiconductors, conductors and superconductors , 2013 .

[18]  Kostiantyn Torokhtii,et al.  Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films , 2014 .

[19]  R. Kutzner,et al.  Dielectric properties of rutile and its use in high temperature superconducting resonators , 1995 .

[20]  J. Booth,et al.  A broadband method for the measurement of the surface impedance of thin films at microwave frequencies , 1994 .

[21]  Apparatus for high-resolution microwave spectroscopy in strong magnetic fields , 2005, cond-mat/0510401.

[22]  S. Anlage,et al.  MEASUREMENT OF RESONANT FREQUENCY AND QUALITY FACTOR OF MICROWAVE RESONATORS : COMPARISON OF METHODS , 1998, cond-mat/9805365.