Fully-automatic visual inspection machine for wafer

The invention provides a fully-automatic visual inspection machine for a wafer, which belongs to the technical field of the machinery and solves the technical problems of low working efficiency and the like in the prior art. The fully-automatic visual inspection machine for the wafer comprises a rack, wherein the rack is provided with a wafer fetching turnplate, a detection turnplate and a material receiving box; a feeding mechanism capable of conveying the wafer to the wafer fetching turnplate is arranged between the rack and the wafer fetching turnplate; a material moving mechanism capable of transferring the wafer on the wafer fetching turnplate to a preset position on the detection turnplate is arranged between the detection turnplate and the wafer fetching turnplate; and an imaging mechanism 1 and an imaging mechanism 2 are arranged above and below the detection turnplate, respectively. The fully-automatic visual inspection machine also comprises an analysis computer connected with the imaging mechanism 1 and the imaging mechanism 2; and a discharging mechanism capable of placing the wafer on the detection turnplate onto different positions in the material receiving box according to a detection result is arranged between the material receiving box and the detection turnplate. Compared with the traditional manual visual inspection mode, the fully-automatic visual inspection machine realizes fully-automatic detection and can improve the working efficiency.