Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements
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Alexandre Brouste | Christophe Voisin | Jean Schmittbuhl | François Renard | David Marsan | Michel Bouchon | François Renard | D. Marsan | M. Bouchon | C. Voisin | T. Candela | J. Schmittbuhl | A. Brouste | Thibault Candela
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