A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation.

A W: B4C multilayer phase retarder has been designed and characterized which shows a nearly constant phase retardance between 640 and 850 eV photon energies when operated near the Bragg condition. This freestanding transmission multilayer was used successfully to determine, for the first time, the full polarization vector at soft x-ray energies above 600 eV, which was not possible before due to the lack of suitable optical elements. Thus, quantitative polarimetry is now possible at the 2p edges of the magnetic substances Fe, Co, and Ni for the benefit of magnetic circular dichroism spectroscopy employing circularly polarized synchrotron radiation.

[1]  Masatada Yuri,et al.  Elliptical-polarization analyses of synchrotron radiation in the 5–80-eV region with a reflection polarimeter , 1991 .

[2]  P. Finetti,et al.  Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions , 2004 .

[3]  F. Schäfers,et al.  Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter. , 1994, Applied optics.

[4]  R. Follath,et al.  The elliptically polarized undulator beamlines at BESSY II , 2001 .

[5]  Laurent Nahon,et al.  First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO , 1999, Optics & Photonics.

[6]  G. Rosenbaum,et al.  Measurement of the polarization of extreme ultraviolet synchrotron radiation with a reflecting polarimeter. , 1968, Applied optics.

[7]  E. Wolf,et al.  Principles of Optics (7th Ed) , 1999 .

[8]  Hiroaki Kimura,et al.  Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV , 2005 .

[9]  N N Salashchenko,et al.  Cr /sc multilayers for the soft-x-ray range. , 1998, Applied optics.

[10]  A. Gaupp,et al.  Elliptically polarizing insertion devices at BESSY II , 2001 .

[11]  F. Schäfers,et al.  W/C, W/Ti, Ni/Ti, and Ni/V Multilayers for the Soft-X-ray Range: Experimental Investigation with Synchrotron Radiation. , 1998, Applied optics.

[12]  David L. Windt,et al.  IMD—software for modeling the optical properties of multilayer films , 1998 .

[13]  W. Hunter,et al.  Design criteria for reflection polarizers and analyzers in the vacuum ultraviolet. , 1978, Applied optics.

[14]  A. Gaupp,et al.  First experimental experience with a VUV polarimeter at BESSY , 1989 .

[15]  T. Shidara,et al.  Polarization analyses of elliptically polarized vacuum ultraviolet undulator radiation , 1993 .

[16]  The effect of misalignment errors in optical elements of VUV polarimeter , 2006 .

[17]  Laurent Nahon,et al.  SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range. , 2004, Applied optics.

[18]  F. Schäfers,et al.  Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light. , 1999, Applied optics.

[19]  Masaki Yamamoto,et al.  Soft x‐ray (97‐eV) phase retardation using transmission multilayers , 1992 .