A New BIST Structure for ADC Test in Mixed-Signal Circuits

A new built-in self-test (BIST) structure for testing analog-to-digital converter (ADC) is presented. Methods and algorithms for calculating ADC's static and signal-to-noise ratio (SNR) parameters are discussed. Using the BIST structure, linear histogram technique can be used to calculate static parameters of ADC's quickly, and the dynamic parameters in frequency domain will be calculated through FFT algorithm, which makes the circuit simple, compact and efficient.