论文信息 - Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs - 字舞流文

Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs

peixiong zhao | R. Reed | R. Baumann | K. Label | R. Weller | L. Massengill | J. Pellish | M. Campola | J. M. Hutson | A. D. Tipton | M. Xapsos | M. Friendlich | X. Deng | G. Boselli | H. Kim | S. Seidleck | A. Marshall