Abnormal Grain Growth in AlScN Thin Films Induced by Complexion Formation at Crystallite Interfaces

[1]  B. Wagner,et al.  Stress controlled pulsed direct current co-sputtered Al1−xScxN as piezoelectric phase for micromechanical sensor applications , 2015 .

[2]  G. Wingqvist,et al.  Origin of the anomalous piezoelectric response in wurtzite Sc(x)Al(1-x)N alloys. , 2010, Physical review letters.

[3]  Paul Muralt,et al.  Microstructure and dielectric properties of piezoelectric magnetron sputtered w-ScxAl1-xN thin films , 2012 .

[4]  Paul Muralt,et al.  Piezoelectric Al1−xScxN thin films: A semiconductor compatible solution for mechanical energy harvesting and sensors , 2013 .

[5]  L. Kirste,et al.  Surface Morphology and Microstructure of Pulsed DC Magnetron Sputtered Piezoelectric AlN and AlScN Thin Films , 2018 .

[6]  R. D. Shannon,et al.  Effective ionic radii in oxides and fluorides , 1969 .

[7]  E. Rauch,et al.  Automated crystal orientation and phase mapping in TEM , 2014 .

[8]  Y. Ide,et al.  Control of preferential orientation of AlN films prepared by the reactive sputtering method , 1998 .

[9]  P. Muralt,et al.  Biaxial texture development in aluminum nitride layers during off-axis sputter deposition , 2012 .

[10]  Jun Lu,et al.  Stabilization of Wurtzite Sc0.4Al0.6N in Pseudomorphic Epitaxial ScxAl1-xN/InyAl1-yN Superlattices , 2015 .

[11]  D. Gall,et al.  Optical phonon modes in Al1−xScxN , 2014 .

[12]  J. Thornton The microstructure of sputter-deposited coatings , 1986 .

[13]  A. Teshigahara,et al.  Influence of growth temperature and scandium concentration on piezoelectric response of scandium aluminum nitride alloy thin films , 2009 .

[14]  R. Spolenak,et al.  The effect of solute segregation on strain localization in nanocrystalline thin films: Dislocation glide vs. grain-boundary mediated plasticity , 2013 .

[15]  M. Cantoni,et al.  Shear mode coupling and tilted grain growth of AlN thin films in BAW resonators , 2006, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

[16]  H. Yasuda,et al.  Preferential void formation at crystallographically ordered grain boundaries in nanotwinned copper thin films , 2015 .

[17]  Nobuaki Kawahara,et al.  Enhancement of Piezoelectric Response in Scandium Aluminum Nitride Alloy Thin Films Prepared by Dual Reactive Cosputtering , 2009, Advanced materials.

[18]  Ventsislav Yantchev,et al.  Aluminum scandium nitride thin-film bulk acoustic resonators for wide band applications , 2011 .

[19]  C. Ballif,et al.  Growth Model of MOCVD Polycrystalline ZnO , 2009 .

[20]  Y. Oshmyansky,et al.  PCS 1900 MHz duplexer using thin film bulk acoustic resonators (FBARs) , 1999 .

[21]  P. Muralt,et al.  Sputtering of (001)AlN thin films: Control of polarity by a seed layer , 2010 .

[22]  B. Wagner,et al.  Identifying and overcoming the interface originating c-axis instability in highly Sc enhanced AlN for piezoelectric micro-electromechanical systems , 2017 .

[23]  D. Depla,et al.  Biaxial alignment in sputter deposited thin films , 2006 .

[24]  P. Frach,et al.  Effect of scandium content on structure and piezoelectric properties of AlScN films deposited by reactive pulse magnetron sputtering , 2017 .

[25]  Paul Muralt,et al.  Piezoelectric and structural properties of c-axis textured aluminium scandium nitride thin films up to high scandium content , 2018, Surface and Coatings Technology.

[26]  A. Artieda,et al.  Electromechanical properties of Al0.9Sc0.1N thin films evaluated at 2.5 GHz film bulk acoustic resonators , 2011 .

[27]  Ulrich Schmid,et al.  High temperature stability of ScxAl1-xN (x=0.27) thin films , 2015, Microtechnologies for the New Millennium.

[28]  M. Akiyama,et al.  Influence of scandium concentration on power generation figure of merit of scandium aluminum nitride thin films , 2013 .

[29]  Paul Muralt,et al.  Stress and piezoelectric properties of aluminum nitride thin films deposited onto metal electrodes by pulsed direct current reactive sputtering , 2001 .

[30]  U. Schmid,et al.  Microstructure and piezoelectric response of YxAl1−xN thin films , 2015 .

[31]  B. Wagner,et al.  Structural study of growth, orientation and defects characteristics in the functional microelectromechanical system material aluminium nitride , 2015 .

[32]  F. Shahedipour-Sandvik,et al.  Density functional theoretical study of surface structure and adatom kinetics for wurtzite AlN , 2009 .

[33]  Paul Muralt,et al.  Properties of aluminum nitride thin films for piezoelectric transducers and microwave filter applications , 1999 .