Canonical computational model for algorithm-based fault tolerance (ABFT) systems

Fault tolerance measures (such as fault detectability and fault locatability) of systems employing Algorithm-Based Fault Tolerance (ABFT) are determined by a binary relationship between fault patterns and error patterns. This relationship specifies whether a given fault pattern can induce a given error pattern. We develop a succinct and canonical representation of this relationship and present an efficient algorithm for obtaining this representation. We show that two ABFT systems have the same fault tolerance measures only when their canonical representation are identical.