Impact of the address changing on the detection of pattern sensitive faults

This paper introduces a new concept for memory testing based on transparent memory tests in terms of pattern sensitive faults detection with different address order generation technique. It is commonly known, that only march tests can be in use now to test modern memory chips. Every march test algorithm can be applied in different ways and still be effective to detect target faults. Using properties of Degrees of Freedom in march testing [6] such as address changing, we can detect Pattern Sensitive Faults (PSF). Combination of march tests with proposed technique allows us to detect all memory faults, including PSF, with a high probability. Used tests are more effective and in many cases, experimental studies even show a higher efficiency of use of simple march tests in connection with proposed technique.