论文信息 - RAS Test Method Based on Data Compatibility Compress

RAS Test Method Based on Data Compatibility Compress

【Abstract】This paper proposes a random access scan and test approach, which deals with the compatible issue of scan unit to produce new test group. Combined with the structure character of Random Access Scan(RAS), this new test group is optimized, which solves the problems such as test data volume, test power dissipation, and test time. This approach is tested in ISCAS’89 benchmark circuits. Experimental results show this approach is effective and feasible. 【Key words】compatibility; Random Access Scan(RAS); test power dissipation 计算机工程 Computer Engineering 第 35卷第 3期 Vol.35 No.3 2009年 2月 February 2009

Yang Qian | Liang Huaguo | Ouyang Yiming

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