High stereographic resolution texture and residual stress evaluation using time-of-flight neutron diffraction
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S. Vogel | Hiroshi Suzuki | J. Inoue | M. Ojima | K. Akita | Y. Tomota | W. Gong | S. Harjo | K. Aizawa | Pingguang Xu | Takayoshi Ito | H. Suzuki | T. Ito