FLICKER NOISE IN THICK-FILM (CERMET) RESISTORS: THE EFFECT OF THE FIRING TEMPERATURE
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Thick-film cermet resistors (TFRs) have been prepared at different stages of their microstructure formation by changing the peak temperature T f of the heating cycle. Measurements have been performed on the power spectral density as a function of frequency (from 0.5 Hz to 20 kHz) measuring temperature (from 95 to 600 K) and firing temperature T f . Sheet resistance and its temperature coefficient have been also measured in samples with various T f .
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