Measurement of Dielectric Parameters at Microwave Frequencies by Cavity-Perturbation Technique

Relations for evaluating dielectric parameters from changes in resonance frequency and Q of a cylindrical TM/sub 010/-mode cavity have been derived for thin samples of length less than the height of the cavity. Although derived under some simplifying assumptions, they reduce to the standard form when the length of the specimen equals the height of the cavity, and yield consistent results when applied to different lengths of the same material.