Model-based estimation of surface geometry using passive polarimetric imaging

Imaging polarimetry has emerged as a powerful tool for application in the field of remote sensing. In this paper, we present a novel technique for estimating the surface normal angle of each of the individual facets of a target object using passive polarimetric data. The passive polarimetric imaging system described here uses multiple measurements of the output Stokes vectors along with the reflection Mueller matrix, to extract the surface normal angle corresponding to individual facets of the target object. The knowledge of this parameter is indispensable for determining the orientation and surface geometry of the target object and thus facilitates applications like object recognition, shape extraction and building scene geometry. The worst-case error is found to be less than 2%, based on Monte Carlo computer simulation results.

[1]  Lawrence B. Wolff,et al.  Polarization phase-based method for material classification and object recognition in computer vision , 1996, Proceedings CVPR IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

[2]  S. R. Meier,et al.  Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces , 2002 .

[3]  P. Gill,et al.  Algorithms for the Solution of the Nonlinear Least-Squares Problem , 1978 .

[4]  Charles D. Creusere,et al.  Material Classification using Passive Polarimetric Imagery , 2007, 2007 IEEE International Conference on Image Processing.

[5]  Lawrence B. Wolff,et al.  Polarization-Based Material Classification from Specular Reflection , 1990, IEEE Trans. Pattern Anal. Mach. Intell..

[6]  Glenn Healey,et al.  Material classification for 3D objects in aerial hyperspectral images , 1999, Proceedings. 1999 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (Cat. No PR00149).

[7]  Hua Chen,et al.  Polarization Phase-Based Method For Material Classification In Computer Vision , 1998, International Journal of Computer Vision.

[8]  D. Voelz,et al.  Polarization-based index of refraction and reflection angle estimation for remote sensing applications. , 2007, Applied optics.

[9]  J. Chris McGlone,et al.  Fusion of HYDICE hyperspectral data with panchromatic imagery for cartographic feature extraction , 1999, IEEE Trans. Geosci. Remote. Sens..

[10]  Jihad Zallat,et al.  Using polarimetric imaging for material classification , 2003, Proceedings 2003 International Conference on Image Processing (Cat. No.03CH37429).

[11]  Shoji Tominaga,et al.  Reflectance-based material classification for printed circuit boards , 2003, 12th International Conference on Image Analysis and Processing, 2003.Proceedings..

[12]  Lawrence B. Wolff Polarization phase-based method for material classification and object recognition in computer vision , 1996, Proceedings CVPR IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

[13]  Michael Bass,et al.  Handbook of optics , 1995 .