论文信息 - Temperature-Dependence of the Leakage Current of 3C-SiC p+-n Diodes Caused by Extended Defects - 字舞流文

Temperature-Dependence of the Leakage Current of 3C-SiC p+-n Diodes Caused by Extended Defects

H. B. Weber | G. Pensl | M. Krieger | H. Nagasawa | N. Hatta | H. Uchida | B. Zippelius | T. Kawahara | K. Yagi | Motoki Kobayashi