论文信息 - Advanced Coherent X-ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on- Si Electronics and Optoelectronics - 字舞流文

Advanced Coherent X-ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on- Si Electronics and Optoelectronics

G. Capellini | W. Masselink | M. Lehmann | S. Leake | Z. Ye | P. Zaumseil | W. Ren | T. Schroeder | M. Schubert | G. Niu | M. Richard | F. Hatami | T. Schülli | T. Niermann | O. Skibitzki | J. Carnis | E. Hussein | F. Kießling