Evaluation of the pseudocapacitance in RuO2 with a RuO2/GC thin film electrode

Abstract The pseudocapacitance of nanocrystalline RuO 2 with BET surface area of 42 m 2  g −1 was evaluated using a RuO 2 modified Glassy Carbon (RuO 2 /GC) thin film electrode. The charge storage behavior of the RuO 2 /GC thin film electrode was studied from fast to slow scan cyclic voltammetry between various potential windows. The utilization of the thin film electrode method for nanocrystalline RuO 2 with known specific surface area allowed a semi-quantitative understanding of the electric double-layer capacitance ( C dl ), adsorption related charge ( C ad ), and the irreversible redox related charge ( C irr ) per unit mass and surface area of RuO 2 . Comparison of the cyclic voltammograms between different voltage windows revealed that the contribution from C irr is especially dominant below 0.4 V (versus RHE) at slow scan rates.

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